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Advanced VLSI Design and Testability Issues 1. Ausgabe
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Advanced VLSI Design and Testability Issues
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
360 pages, 29 Tables, black and white; 192 Illustrations, black and white
| Medien | Bücher Taschenbuch (Buch mit Softcover und geklebtem Rücken) |
| Erscheinungsdatum | 15. April 2022 |
| ISBN13 | 9780367538361 |
| Verlag | Taylor & Francis Ltd |
| Seitenanzahl | 360 |
| Maße | 154 × 234 × 35 mm · 570 g |
| Sprache | Englisch |
| Redakteur | Mohapatra, Sushanta Kumar (Kalinga Institute of Industrial Technology, India.) |
| Redakteur | Saxena, Sobhit (Lovely Professional University University, India.) |
| Redakteur | Tripathi, Suman Lata (Lovely Professional University, India) |
