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Testing of Interposer-Based 2.5D Integrated Circuits Softcover reprint of the original 1st ed. 2017 edition
Ran Wang
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Testing of Interposer-Based 2.5D Integrated Circuits Softcover reprint of the original 1st ed. 2017 edition
Ran Wang
The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies.
182 pages, 50 Tables, color; 102 Illustrations, color; 16 Illustrations, black and white; XIV, 182 p
Medien | Bücher Taschenbuch (Buch mit Softcover und geklebtem Rücken) |
Erscheinungsdatum | 9. Mai 2018 |
ISBN13 | 9783319854618 |
Verlag | Springer International Publishing AG |
Seitenanzahl | 182 |
Maße | 285 g |
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